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Title | Contribution of the grain-boundary and surface scattering of conductivity electrons to the size effect of tensosensibility |
Authors |
Chornous, Anatolii Mykolaiovych
Lasiuchenko, Olena Borysivna Protsenko, Ivan Yukhymovych |
ORCID |
http://orcid.org/0000-0002-5009-5445 http://orcid.org/0000-0003-3351-9303 |
Keywords |
grain-boundary scattering surface scattering size effect of tensosensibility зернограничне розсіювання поверхневе розсіювання розмірний ефект тензочутливості зернограничное рассеивание поверхностное рассеивание размерный эффект тензочувствительности |
Type | Article |
Date of Issue | 1999 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/709 |
Publisher | Institute for Single Crystals |
License | |
Citation | Lasyuchenko, O.B. Contribution of the grain-boundary and surface scattering of conductivity electrons to the size effect of tensosensibility [Text] / O.B. Lasyuchenko, I.Yu. Protsenko, A.M. Chornous // Functional Materials 6, №. 5, 880-883 (1999). |
Abstract |
Theoretical relations have been obtained allowing to estimate the contribution of volume, surface and grain boundary scattering electrons of conductivity to the longitudinal tensosensibility coefficient of metal films. These contributions can be additively presented as у = C1Y0l + C2Ygbl + C3ydl where C1-C3 are the statistical weights of individual components. The relationships derived have been proven taking Cr, Co, Ni and Cu thin films as examples.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/709 |
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