Structure Features of Bismuth Films Doped with Tellurium

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Title	Structure Features of Bismuth Films Doped with Tellurium
Authors	Matveev, D.Yu. Starov, D.V. Demidov, E.V.
ORCID
Keywords	thin films impurity bismuth tellurium growth figure crystallite size
Type	Article
Date of Issue	2018
URI	http://essuir.sumdu.edu.ua/handle/123456789/68636
Publisher	Sumy State University
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Citation	Matveev, D.Yu. Structure Features of Bismuth Films Doped with Tellurium [Текст] / D.Yu. Matveev, D.V. Starov, E.V. Demidov // Журнал нано- та електронної фізики. - 2018. - Т. 10, № 2. - 02047. - DOI: 10.21272/jnep.10(2).02047.
Abstract	The influence of doping degree on the structural characteristics of bismuth films doped with tellurium in the concentration range 0.005-0.150 at. % Te and the thickness range 0.3-0.7 µm is studied at present article. Authors have established that an increase of the doping degree with tellurium in bismuth films leads to a significant decreasing of the growth figures. The weak influence of annealing on the crystallite size of bismuth films doped with tellurium indicates their high temporal stability of the structure.
Appears in Collections:	Журнал нано- та електронної фізики (Journal of nano- and electronic physics)