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Title Composition dependence of structural and optical properties of Cd1−xZnxTe thick films obtained by the close-spaced sublimation
Authors Kosiak, Volodymyr Volodymyrovych
Znamenshchykov, Yaroslav Volodymyrovych  
Čerškus, А.
Gnatenko, Yu.P.
Grase, L.
Vecstaudza, J.
Medvids, A.
Opanasiuk, Anatolii Serhiiovych  
Mezinskis, G.
ORCID http://orcid.org/0000-0002-6866-0414
http://orcid.org/0000-0002-1888-3935
Keywords Кристалічна структура
Кристаллическая структура
Crystal structure
Потрійні напівпровідникові сполуки
Тройные полупроводниковые структуры
Semiconducting ternary compounds
Дефекти кристалічної гратки
Дефекты кристаллической решетки
Lattice defects
Type Article
Date of Issue 2016
URI http://essuir.sumdu.edu.ua/handle/123456789/46175
Publisher Journal of Alloys and Compounds
License
Citation Composition dependence of structural and optical properties of Cd1−xZnxTe thick films obtained by the close-spaced sublimation [Text] / V.V. Kosiak, Ya.V. Znamenshchykov, А. Čerškus [et al.] // Journal of Alloys and Compounds. - 2016. - No. 682. - P. 543–551.
Abstract This paper reports the results of structural, photoluminescence and Raman characterization of thick Cd1−xZnxTe films with different zinc concentration obtained by the close spaced vacuum sublimation method. The analysis of the X-rays patterns allows us to determine the effect of the zinc concentration on crystal quality of the films. It was found that samples with x ≈ 0.10 and x ≈ 0.32 have high crystal quality. However, with increasing of zinc concentration the crystal quality decreases. This result was confirmed by the photoluminescence study. Namely, the significant degradation of optical properties for the samples with high zinc concentration (x > 0.32) was observed. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Also, the micro-Raman method shows that obtained films are uniform and free of tellurium inclusions.
Appears in Collections: Наукові видання (ЕлІТ)

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