Morphological, structural, compositional properties and IR-spectroscopy of CdSe films deposited by close-spaced vacuum sublimation

Ivashchenko, Maksym Mykolaiovych; Opanasiuk, Anatolii Serhiiovych; Perekrestov, Viacheslav Ivanovych; Kosiak, Volodymyr Volodymyrovych; Hnatenko, Yurii Pavlovych; Коломієць, Володимир Миколайович; Коломиец, Владимир Николаевич; Kolomiets, Volodumur Mykolayovuch

Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/43119

Or use following links to share this resource in social networks: Recommend this item

Title	Morphological, structural, compositional properties and IR-spectroscopy of CdSe films deposited by close-spaced vacuum sublimation
Authors	Ivashchenko, Maksym Mykolaiovych Opanasiuk, Anatolii Serhiiovych Perekrestov, Viacheslav Ivanovych Kosiak, Volodymyr Volodymyrovych Hnatenko, Yurii Pavlovych Коломієць, Володимир Миколайович Коломиец, Владимир Николаевич Kolomiets, Volodumur Mykolayovuch
ORCID	http://orcid.org/0000-0002-4611-0956 http://orcid.org/0000-0002-1888-3935 http://orcid.org/0000-0002-8173-3948
Keywords	тонкі плівки тонкие пленки Thin films RBS CdSe рентгеноструктурний аналіз рентгеноструктурный анализ X-ray diffraction analysis морфологія поверхні морфология поверхности Surface morphology
Type	Article
Date of Issue	2015
URI	http://essuir.sumdu.edu.ua/handle/123456789/43119
Publisher	Vacuum
License
Citation	Morphological, structural, compositional properties and IR-spectroscopy of CdSe films deposited by close-spaced vacuum sublimation [Текст] / M.M. Ivashchenko, A.S. Opanasyuk, V.I. Perekrestov, V.V. Kosyak and al // Vacuum. - 2015 . - Vol.119. - P.81-87.
Abstract	The polycrystalline CdSe films were deposited by the close-spaced vacuum sublimation technique at the different substrate temperatures (373e873 K). Surface morphology, grain size and growth mechanism of the films were determined by the scanning electron microscopy. The X-ray diffraction analysis of structural and sub-structural properties of the films was carried out to study their phase composition and growth texture. The main structural parameters of thin films, such as texture, lattice parameter, grain size, scattering domain size and micro-stress level have been determined in the work depending on the condensation film conditions. RBS and FTIR analysis shows that obtained films in general are homogenous and pure. As a result, the growth conditions of CdSe polycrystalline films with good crystal quality were determined.
Appears in Collections:	Наукові видання (ЕлІТ)