Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/42804
Title: Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film
Authors: Konno, T.
Ren, L.
Piao, G.
Juárez García, J.M.
Suárez, F.M.
Jimenez-Sandoval, S.J.
Wakahara, T.
Miyazawa, K.
Ferreira, E.M.
Keywords: C60
Fullerene
Thin film
Raman spectrometry
Uncertainty
Issue Year: 2015
Publisher: Sumy State University
Citation: Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film [Текст] / K. Miyazawa, T. Konno, L. Ren et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No1. — 01MAN02.
Abstract: Measurement of Raman shifts of a C60 thin film and the evaluation of their uncertainties were conducted. A C60 thin film with a thickness of about 1.2 μm was fabricated on a SiO2 substrate by vacuum deposition. Raman spectra of the C60 thin film were obtained using the laser beam power density of 5.7 103 mW mm-2. The measured Raman shifts were corrected according to the calibration curve that was prepared using sulfur and naphthalene as the reference samples. Standard uncertainties were calculated and combined in order to determine the combined uncertainty and the expanded uncertainty. It was found that the increase of measurement time and measurement points for the calibration curve leads to the higher reliability.
URI: http://essuir.sumdu.edu.ua/handle/123456789/42804
Type: Theses
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