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Title Raman analysis of Zn1-xMnxTe polycrystalline films
Authors Klymov, Oleksii Volodymyrovych
Kurbatov, Denys Ihorovych  
Opanasiuk, Anatolii Serhiiovych  
Kosiak, Volodymyr Volodymyrovych
Копач, В.
Копач, В.
Kopach, V.
Болотников, А.Е.
Болотников, А.Е.
Bolotnikov, А.Е.
Джеймс, Р.Б.
Джеймс, Р.Б.
James, R.B.
Фочук, П.М.
Фочук, П.М.
Fochuk, P.M.
ORCID http://orcid.org/0000-0002-2754-6367
http://orcid.org/0000-0002-1888-3935
Keywords Raman spectroscopy
surface morphology
x-ray diffraction
lattice parameters
solid solution of Zn1-xMnxTe
closed space vacuum sublimation
Type Article
Date of Issue 2013
URI http://essuir.sumdu.edu.ua/handle/123456789/33848
Publisher SPIE
License
Citation Raman analysis of Zn1-xMnxTe polycrystalline films [Text] / О. V. Klimov , D. I. Kurbatov , A. S. Opanasyuk , V. V. Kosyak , V. Kopach , P. M. Fochuk , A. E. Bolotnikov, R. B. James // Proc. of SPIE. – 2013. – P. 88521G-1-88521G-5.
Abstract In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33848
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