Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/20616
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Title Investigation of the self-similar structure of the carbon thin films
Authors Borysiuk, Vadym Mykolaiovych
ORCID
Keywords self-similarity
самоподобие
самоподібність
carbon thin films
углеродные тонкие пленки
вуглецеві плівки
Type Conference Papers
Date of Issue 2011
URI http://essuir.sumdu.edu.ua/handle/123456789/20616
Publisher Видавництво СумДУ
License
Citation Borisyuk, V.N. Investigation of the self-similar structure of the carbon thin films [Текст] / V.N. Borisyuk // Nanomaterials: applications & properties. Proceedings : 1-st International conference, Alushta, Crimea, 27-30 Semptember 2011 / Edited by: A. Pogrebnjak, T. Lyutyy, S. Protsenko. — Sumy : Sumy State University, 2011. — V.1, P.ІІ. — C. 317-319.
Abstract Self-similar structure of the carbon thin films, obtained by magnetron sputtering is investigated numerically. Statistical parameters are calculated within two dimensional multifractal detrended fluctuation analysis. The numerical model for the surfaces under investigation was build from the SEM images of the carbon thin films. It is shown that the self-similarity in surface roughness preserves over all fragments of the sample, and through different resolutions of the SEM images. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/20616
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