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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2013 | Comparison of Atomic Level Simulation Studies of MOSFETs Containing Silica and Lantana Nanooxide Layers | Bikshalu, K.; Manasa, M.V.; Reddy, V.S.K.; Reddy, P.C.S.; Venkateswara Rao, K. | Article | -72679473 | 472864605 |